ZYGO 8070-0102-01X + PC200 – Advanced Optical Surface Profilometer

1. Product Title

ZYGO 8070-0102-01X + PC200 – Advanced Optical Surface Profilometer

2. Product Overview

The ZYGO 8070-0102-01X + PC200 is a sophisticated optical surface profilometer system designed to deliver high-precision measurement of surface topography, roughness, and flatness for a wide range of industrial applications. This system incorporates ZYGO’s renowned interferometry technology and combines it with a powerful PC200 control platform for seamless data acquisition and analysis. The 8070-0102-01X + PC200 is ideal for industries such as semiconductor manufacturing, precision optics, and materials research, where absolute accuracy in surface characterization is essential. Its high resolution, rapid measurement capabilities, and versatile software make it an indispensable tool for quality control and R&D in environments that demand the highest level of surface metrology.

3. Technical Specifications

• Brand: ZYGO

• Model: ZYGO 8070-0102-01X + PC200

• Warranty: One Year

• Condition: 100% New & Original

• Measurement Principle: Optical Interferometry

• Measurement Range: 25 mm x 25 mm

• Resolution: Sub-nanometer (0.1 nm)

• Surface Measurement Accuracy: ±0.05 nm

• Data Acquisition Speed: Up to 2 Hz

• Control Platform: PC200 (Included)

• Power Supply: 100-240 V AC, 50/60 Hz

• Operating Temperature Range: 18°C to 30°C

• Weight: Approximately 20 kg

• Dimensions: 650 mm x 500 mm x 350 mm

• Communication Protocol: Ethernet, USB, RS-232

4. Key Features & Benefits

• Precision Interferometric Measurement: The ZYGO 8070-0102-01X + PC200 utilizes state-of-the-art optical interferometry to achieve sub-nanometer resolution and high measurement accuracy (±0.05 nm), making it ideal for critical surface measurements in industries like semiconductor and precision optics.

• Fast Data Acquisition: With the ability to collect surface data at speeds up to 2 Hz, this system enhances productivity, especially in high-throughput environments where rapid inspection of multiple parts or large surfaces is necessary.

• Versatile Measurement Range: The system supports a measurement range of 25 mm x 25 mm, offering flexibility for both small component analysis and larger surface evaluations. This ensures its applicability across a variety of industries and product sizes.

• Integrated Control Platform (PC200): The inclusion of the PC200 control platform simplifies data management and analysis, providing intuitive software that allows users to visualize, analyze, and export measurement data with ease.

• Robust Design for Industrial Environments: Built for industrial applications, the 8070-0102-01X + PC200 is designed to withstand challenging environments and maintain performance in both laboratory and production settings.

5. Application Scenarios

• Semiconductor Fabrication: The ZYGO 8070-0102-01X + PC200 is used in semiconductor fabrication to inspect and measure wafer surfaces, ensuring they meet strict tolerances for flatness and roughness, which is critical for IC production.

• Optical Lens Manufacturing: This profilometer is ideal for precision measurements of optical surfaces, such as lenses, mirrors, and prisms, ensuring that optical components meet the necessary specifications for high-performance imaging systems.

• Materials Research & Development: In materials science, the ZYGO 8070-0102-01X + PC200 is used to evaluate the surface properties of new materials, helping researchers understand how surface roughness and flatness impact material performance and functionality.

6. Frequently Asked Questions (FAQ)

• Q: What is the primary function of the ZYGO 8070-0102-01X + PC200?

  • A: The ZYGO 8070-0102-01X + PC200 is an advanced optical surface profilometer that uses interferometry to measure surface topography, roughness, and flatness with sub-nanometer resolution, making it ideal for precision industries like semiconductor manufacturing and optics.

• Q: What type of control system is used with the ZYGO 8070-0102-01X + PC200?

  • A: The ZYGO 8070-0102-01X + PC200 includes the PC200 control platform, which enables easy integration, measurement data visualization, analysis, and export, providing a seamless user experience in industrial environments.

• Q: Can the ZYGO 8070-0102-01X + PC200 be used for large surface measurements?

  • A: The ZYGO 8070-0102-01X + PC200 has a measurement range of 25 mm x 25 mm, which makes it suitable for a wide variety of applications, though it may not be ideal for extremely large-scale surface measurements. However, it is highly effective for detailed analysis of smaller components and surfaces.